Adapters & Fixtures

The HC-1200(1200A) high current deck extends the current available from the 5300C/5300HVC semiconductor tester. On-state current tests such as VT, VF, VCESAT, VDSON, and RDSON can be extended to 1200A.

• ADP-310 opto-coupler adaptor
• ADP-320 regulator (3 terminal) adaptor. Requires a test fixture – see Test Fixtures
• ADP-340-5G same as ADP-340-5 plus gated device option
• ADP-350 quadrac and diac adaptor. Requires a test fixture – see Test Fixtures
• ADP-360 adaptor to test transient surge devices (SSOVP), sidacs and diacs.
• ADP-370 8-pin opto logic device adaptor
• ADP-380 Kelvin adaptor
• ADP-506 I latch load box for exact lactching measurements
• ADP-508 adaptor for 5 lead devices with current sense to 10ma and Kelvin pins – also called HEX sense
• Other test Adaptors are available… just let us know what you need.

Numerous standard device test fixtures are available to provide proper lead connection to specific semiconductor package designs. Custom test fixtures can be provided for any device type for which a socket is commercially available. Consult Factory.

Discrete Test Fixtures

K in prefix indicates Kelvin dual contacts for drive and sense

A version indicates anode center pin

G version indicates gate center pin

C version indicates cathode on stud

• FX-T220 A or G – TO-220 and TO-218
• FXK-T220 A or G – TO-220 and TO-218
• FX-L220 A or G – TO-220, low insertion force
• FX-T72A – TO-72, four leaded socket
• FXK-T5/18G TO-5/18G
• FX-T92G – TO-92
• FXK-T3/66 – TO-3/66, lead diameter less than 0.060inche, for collector currents less than 25A
• FXK-T3/P G – TO-3/P • FXK-AXS axial small diode, lead diameter up to 0.040 inche
• FXK-AXL axial large diode, lead diameter up to 0.050 inche
• FXK-D4/5 A or C – DO-4 and DO-5
• FXK-5SNS 5 lead hex sense fixture

Discrete Opto-Coupler Test Fixtures

• OPT-T56 6-pin can (TO-5) single opto device
• OPT-T58 8-pin can (TO-5) dual opto device, manually switched
• OPT-DP6 6 pin dip opto device (same as upper half of OPT-DP68)
• OPT-DP68 6 or 8 pin dip opto device, manually switch)
• OPT-6N139 8 pin dip opto-coupler, relays software selectable, requires external power supply

Surface Mount Test Fixtures

K in prefix indicates Kelvin
• SM-SO-4 SO-4 package
• SM-SO-6 SO-6 package
• SM-SO-8 SO-8 package
• SM-SO-12 SO-12 package
• SM-SO-16 SO-16 package
• SM-SOD123 SOD-123 package
• SMK-SD3232 SOD-323 2 lead package
• SM-SOD80 SOD-80 package
• SM-SOT23 SOT-23 package
• SMK-SOT23 SOT-23 package
• SMK-SOT24 SOT-24 package
• SMK-SOT25 SOT-25 package
• SMK-SOT26 SOT-26 package
• SM-DPAK D-PAK or TO-252 package, transistor
• SM-SOT89 SOT-89 or TO-243 package
• SM-D2PAK D2PAK package
• SMK-SOT223 SOT-223 package
• SMK-SMA SMA package
• SMK-SMB SMB package
• SMK-SMC SMC package
• SMK-MELF Melf package, diode
• SMK-MINIM Mini-melf package, diode
• SMK-MICRM Micro-melf package, diode
• SMK-QUADM Quadro-melf package, diode

Test Fixture Accessories

• • FX-CUST custom test fixture per customer requirements
  • FX-BLNK blank fixture enclosure, drilled. Includes banana jacks, ferrite beads, coil.
  • FX-COIL oscillation supression coil
  • FX-SCKT replacement sockets for fixtures are available

A 16 bin handler interface and logic prober interface boards are available as options for both the 5300C and 5300HVC. Customer may specify handler and interface requirements. Bins or sorts can be binary coded for se with wafer probers.

Any input (drive/sense) can be programmed to any of 16 output pins. A personality module contains a socket for a specified package type. The pins of the package can be connected to any of the input drives for a given test step. Bias supplies can be added.

• • • ADP-401A-16 Scanner for 16 pins (4×16 matrix), totally programmable, 30A, 1200V